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Precise Light Source and Material Measurement with the Gonio'2pi Gonioradiometer
The gonio'2pi Gonioradiometer, developed by our esteemed partner opsira, offers a professional and accurate solution for measuring the properties of light sources and luminaires, as well as the scattering behavior (BSDF measurements) of materials and surfaces. Its high dynamic measurement range provides flexibility and precision for various optical applications. The goniometer is available in two configurations: a near-field photogoniometer setup (si) for light sources and a scattered light configuration (bsdf) for surface scattering measurements. Additionally, a comprehensive version supports both applications, and easy upgrades between the si and bsdf configurations ensure adaptability as your measurement needs evolve. This versatile system accommodates everything from small light sources to large luminaire systems and even extends to Gonioradiospectrometer analysis for material properties.
Importance of Realistic Optical Simulations Using Material Data
In the world of modern optics, the need for accurate and realistic optical simulations is more critical than ever. Achieving this realism requires precise measurement of the optical properties of materials, including surface and volume scattering, which significantly affect how light interacts with those materials. These factors are crucial across various applications, from lighting technology to scientific instruments. Scattering behavior, influenced by reflection, refraction, and light diffusion, must be thoroughly understood and accurately described. This level of detail is only possible through sophisticated measurement techniques that capture the intricate interactions between light and materials.
4-Axis Gonioradiometer: The Key to Comprehensive Measurements
To obtain complete and accurate data on a material's scattering properties, a 4-axis gonioradiometer is essential. This advanced tool captures scattering behavior across all relevant angles and directions, ensuring a comprehensive understanding of a material’s anisotropic properties. Measuring scattering data from multiple perspectives is vital for achieving realistic simulations in optical designs.
Spectral Scattering Distribution for Advanced Applications
Depending on the requirements of a particular application, the spectral scattering distribution of a material may also be necessary. This data reveals how materials scatter light of different wavelengths, which is particularly important in applications where color fidelity and shading play a significant role, such as in display technology or precision lighting systems.
Seamless Integration with Optical Simulation Software
For maximum effectiveness, the data captured by the gonioradiometer can be easily exported into widely used optical simulation programs such as FRED from Photon Engineering. This seamless integration enables developers to input realistic material properties into their simulations, enhancing the accuracy of their designs. Accurate simulation of a material's optical behavior, based on precise measurements, is the cornerstone of innovative advancements in lighting and optical technologies.
We are proud to partner with opsira and represent them in North America through CBS Inc., bringing their innovative gonio'2pi Gonioradiometer to a wider range of professionals in the optical field. This collaboration allows us to provide professionals across the optical industry with access to advanced, high-precision measurement tools that enhance both design and analysis.
Through our partnership, CBS Inc. proudly delivers industry-leading solutions like the gonio'2pi Gonioradiometer to our North American clients. Together with opsira, we are dedicated to equipping the optical community with tools that elevate the accuracy and efficiency of design, simulation, and measurement processes.
Discover more about how the gonio'2pi Gonioradiometer can enhance your optical measurement and simulation workflows.